前処理(IM・CP)

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Ion milling preprocessing

イオンミリング・クロスセクションポリッシャの前処理

When polishing using the argon ion beam unit, the state of the sample before applying the unit has a major impact on the finish.
The IS-POLISHER has a special holder for the devices of various manufacturers to make it possible to accurately and cleanly finish heretofore difficult flat surface and perpendicular surface polishing in a short time and to easily perform preprocessing.
This is optimum for ion milling preprocessing, cross-section polishing and flat milling.
*Holders that match the sample tables of the E-3500 and IM4000 (IM:Hitachi High-Technologies) and cross-section polisher (CP:JEOL) are available.

Argon ion beam sample preprocessing using IS-POLISHER

This special holder for attaching CP/IM sample tables produces good flat and perpendicular polishing accuracy.

アルゴンイオンビーム用の試料作成
EBSDの試料作成

Use mounting wax, etc., to fix the sample to the sample table.

ブロックへ取り付け

Attach the sample block to the clamp block and set it in the end surface direction to the holder base.
(When necessary, attach the auxiliary plate.)

端面側の研磨

Set the end surface side to be polished to the holder base

End surface side polishing

ブロックの組み替え

Remove the auxiliary plate and change the clamp block orientation to face the sample’s top surface in the direction to be polished and reattach the block.

平面研磨

Set the side to be flat polished to the holder base

Flat side polishing

試料の完成

To argon ion beam processing

  • Ion milling
  • Cross-section polisher

Example required time: Approx. 5-10 min for SUS304, 5 mm square × t2 sample.

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